Optical and surface probe investigation of secondary phases in Cu2ZnSnS4 films grown by electrochemical deposition
- 주제(키워드) Cu2ZnSnS4 , Electrochemical deposition , Work function , Secondary phases , Kelvin probe force microscopy , Raman scattering spectroscopy
- 등재 SCIE, SCOPUS
- 발행기관 ELSEVIER SCIENCE BV
- 발행년도 2015
- 총서유형 Journal
- URI http://www.dcollection.net/handler/ewha/000000115883
- 본문언어 영어
- Published As http://dx.doi.org/10.1016/j.solmat.2015.03.003
