Estimation of multiexponential fluorescence decay parameters using compressive sensing
- 주제(키워드) compressive sensing , fluorescence decay parameters , fluorescence lifetime imaging microscopy , multiexponential decay
- 등재 SCIE, SCOPUS
- 발행기관 SPIE
- 발행년도 2015
- 총서유형 Journal
- URI http://www.dcollection.net/handler/ewha/000000119602
- 본문언어 영어
- Published As http://dx.doi.org/10.1117/1.JBO.20.9.096003
- 저작권 이화여자대학교 논문은 저작권에 의해 보호받습니다.
초록/요약
Fluorescence lifetime imaging microscopy (FLIM) is a microscopic imaging technique to present an image of fluorophore lifetimes. It circumvents the problems of typical imaging methods such as intensity attenuation from depth since a lifetime is independent of the excitation intensity or fluorophore concentration. The lifetime is estimated from the time sequence of photon counts observed with signal-dependent noise, which has a Poisson distribution. Conventional methods usually estimate single or biexponential decay parameters. However, a lifetime component has a distribution or width, because the lifetime depends on macromolecular conformation or inhomogeneity. We present a novel algorithm based on a sparse representation which can estimate the distribution of lifetime. We verify the enhanced performance through simulations and experiments. © The Authors. Published by SPIE under a Creative Commons Attribution 3.0 Unported License.
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