Optimal burn-in procedure for mixed populations based on the device degradation process history
- 주제(키워드) Burn-in , Cost optimization , Degradation process , Mixed population , Non-homogeneous gamma process
- 등재 SCIE, SCOPUS
- 발행기관 Elsevier
- 발행년도 2015
- 총서유형 Journal
- URI http://www.dcollection.net/handler/ewha/000000123078
- 본문언어 영어
- Published As http://dx.doi.org/10.1016/j.ejor.2015.12.019
- 저작권 이화여자대학교 논문은 저작권에 의해 보호받습니다.
초록/요약
Burn-in is a method of 'elimination' of initial failures (infant mortality). In the conventional burn-in procedures, to burn-in an item means to subject it to a fixed time period of simulated use prior to actual operation. Then, the items which failed during burn-in are just scrapped and only those which survived the burn-in procedure are considered to be of satisfactory quality. Thus, when the items are subject to degradation phenomena, those whose degradation levels at the end of burn-in exceed a given failure threshold level are eliminated. In this paper, we consider a new burn-in procedure for items subject to degradation phenomena and belonging to mixed populations composed of a weak and a strong subpopulation. The new procedure is based on the 'whole history' of the degradation process of an item periodically observed during the burn-in and utilizes the information contained in the observed degradation process to assess whether the item belongs to the strong or weak subpopulation. The problem of determining the optimal burn-in parameters is considered and the properties of the optimal parameters are derived. A numerical example is also provided to illustrate the theoretical results obtained in this paper. © 2015 Elsevier B.V. and Association of European Operational Research Societies (EURO) within the International Federation of Operational Research Societies (IFORS).
more