A Second-Order Operator Splitting Fourier Spectral Method for Models of Epitaxial Thin Film Growth
- 주제(키워드) Epitaxial thin film growth , Fourier spectral method , High-order accuracy , Operator splitting method
- 관리정보기술 faculty
- 등재 SCIE, SCOPUS
- 발행기관 Springer New York LLC
- 발행년도 2017
- 총서유형 Journal
- URI http://www.dcollection.net/handler/ewha/000000141650
- 본문언어 영어
- Published As http://dx.doi.org/10.1007/s10915-016-0340-4
초록/요약
In this paper, we develop an operator splitting Fourier spectral method for models of epitaxial thin film growth with and without slope selection. A main idea of the method is to split the original equation into linear and nonlinear parts, and then to evolve one step which consists of three substeps. The linear part is solved by the spectral method, which has a closed-form solution in the Fourier space. And the nonlinear part is also solved by the spectral method combined with the Crank–Nicolson type method. We numerically demonstrate that our method achieves spectral accuracy in space and second-order accuracy in time and alleviates restriction on the time step. We also perform long time simulations for the coarsening process to show the capability of the method. © 2017 Springer Science+Business Media New York
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