Prediction of the residual failure processes based on the process history
- 주제(키워드) Prediction , Process history , Renewal process , Residual failure process
- 등재 SCIE, SCOPUS
- 발행기관 Taylor and Francis Inc.
- 발행년도 2017
- 총서유형 Journal
- URI http://www.dcollection.net/handler/ewha/000000145598
- 본문언어 영어
- Published As http://dx.doi.org/10.1080/03610926.2015.1122059
초록/요약
In the reliability area, the concept of the residual lifetime of a non repairable system is very important and its property has been intensively studied. In this article, we define the “residual failure process” for a repairable system and study its stochastic properties thoroughly. The detailed discussions are given when the corresponding failure process is a renewal process. An illustrative example is also discussed. © 2017 Taylor & Francis Group, LLC.
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