Trapping charges at grain boundaries and degradation of CH3NH3Pb(I1-xBrx)(3) perovskite solar cells
- 주제(키워드) perovskite solar cells , stability , Kelvin probe force microscopy
- 등재 SCIE, SCOPUS
- 발행기관 IOP PUBLISHING LTD
- 발행년도 2017
- URI http://www.dcollection.net/handler/ewha/000000147084
- 본문언어 영어
- Published As http://dx.doi.org/10.1088/1361-6528/aa727e
초록/요약
The electrical properties of CH3NH3Pb(I1-xBrx)(3) (x = 0.13) perovskite materials were investigated under ambient conditions. The local work function and the local current were measured using Kelvin probe force microscopy and conductive atomic force microscopy, respectively. The degradation of the perovskite layers depends on their grain size. As the material degrades, an additional peak in the surface potential appears simultaneously with a sudden increase and subsequent relaxation of the local current. The potential bending at the grain boundaries and the intragrains is the most likely reason for the change of the local current surface of the perovskite layers. The improved understanding of the degradation mechanism garnered from this study helps pave the way toward an improved photo-conversion efficiency in perovskite solar cells.
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