Regularized Auto-Encoder-Based Separation of Defects from Backgrounds for Inspecting Display Devices
- 주제(키워드) defect separation , defect inspection , machine vision , deep learning , object detection
- 주제(기타) Engineering, Electrical & Electronic
- 설명문(일반) [Jo, Heeyeon; Kim, Jeongtae] Ewha Womans Univ, Elect & Elect Engn, Seoul 03760, South Korea
- 등재 SCIE, SCOPUS
- OA유형 gold, Green Submitted
- 발행기관 MDPI
- 발행년도 2019
- URI http://www.dcollection.net/handler/ewha/000000159959
- 본문언어 영어
- Published As http://dx.doi.org/10.3390/electronics8050533
초록/요약
We investigated a novel method for separating defects from the background for inspecting display devices. Separation of defects has important applications such as determining whether the detected defects are truly defective and the quantification of the degree of defectiveness. Although many studies on estimating patterned background have been conducted, the existing studies are mainly based on the approach of approximation by low-rank matrices. Because the conventional methods face problems such as imperfect reconstruction and difficulty of selecting the bases for low-rank approximation, we have studied a deep-learning-based foreground reconstruction method that is based on the auto-encoder structure with a regression layer for the output. In the experimental studies carried out using mobile display panels, the proposed method showed significantly improved performance compared to the existing singular value decomposition method. We believe that the proposed method could be useful not only for inspecting display devices but also for many applications that involve the detection of defects in the presence of a textured background.
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