Secure Integrated Circuit with Physical Attack Detection based on Reconfigurable Top Metal Shield
- 주제(키워드) Terms-Active shield , hardware security , invasive attack , micro-probing attempt , top metal shield
- 주제(기타) Engineering, Electrical & Electronic; Physics, Applied
- 설명문(일반) [Mun, Yeongjin; Kim, Hyungseup; Lee, Byeoncheol; Han, Kwonsang; Kim, Jaesung; Ko, Hyoungho] Chungnam Natl Univ, Dept Elect Engn, Daejeon, South Korea; [Kim, Ji-Hoon] Ewha Womans Univ, Dept Elect & Elect Engn, Seoul, South Korea; [Choi, Byong-Deok; Kim, Dong Kyue] Hanyang Univ, Dept Elect Engn, Seoul, South Korea
- 등재 SCIE, SCOPUS, KCI등재
- 발행기관 IEEK PUBLICATION CENTER
- 발행년도 2019
- URI http://www.dcollection.net/handler/ewha/000000160545
- 본문언어 영어
- Published As http://dx.doi.org/10.5573/JSTS.2019.19.3.260
초록/요약
Invasive physical attacks on integrated circuits (ICs), such as de-packaging, focused ion beam (FIB) chip editing, and micro-probing attempts, constitute security threats for chips with potentially valuable information, such as smart cards. Using a state-of-the-art circuit-editing technique, an attacker can remove an IC's top metal layer, leaving its secure information exposed to micro-probing attacks. Security ICs can be seriously threatened by such attacks and thus require on-chip countermeasures. Conventional active shields, however, have difficulty coping with physical attacks based on FIB chip editing (i.e., bypassing the top metal shield). This study presents a novel countermeasure against physical attacks based on the use of a reconfigurable metal shield for both top metal removal and micro-probing attack detection. This shield consists of two circuits: an FIB chip editing detection circuit consisting of a random number generator and a micro-probing attempt detection circuit consisting of two conditionally synchronized ring oscillators. Both circuits share a randomly reconfigured top metal shield, which represents a promising solution for security against state-of-the-art invasive attacks.
more